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Mohamed El Bouanani

Title: Associate Professor

Department: Materials Science and Engineering

College: College of Engineering

Curriculum Vitae

Curriculum Vitae Link

Education

  • PhD, Universite Claude Bernard Lyon I, 1990
    Major: Physics
  • , Universite Claude Bernard Lyon I, 1986
    Major: Nuclear and Atomic Physics and Applications

Current Scheduled Teaching

MTSE 5600.005Materials CharacterizationFall 2024
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2024

Previous Scheduled Teaching

MTSE 4070.005Electronic MaterialsSpring 2024 Syllabus SPOT
MTSE 5100.007Fundamental Concepts of Materials ScienceSpring 2024 SPOT
MTSE 3000.007Fundamentals of Materials Science and Engineering ISpring 2024 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2024 SPOT
MTSE 5600.005Materials CharacterizationFall 2023 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2023 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2023 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2023 SPOT
MTSE 5100.007Fundamental Concepts of Materials ScienceFall 2022 SPOT
MTSE 3000.003Fundamentals of Materials Science and Engineering IFall 2022 Syllabus SPOT
MTSE 5600.005Materials CharacterizationFall 2022 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2022 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2022 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2022 SPOT
MTSE 3000.003Fundamentals of Materials Science and Engineering IFall 2021 Syllabus SPOT
MTSE 6940.005Individual ResearchFall 2021
MTSE 6940.105Individual ResearchFall 2021
MTSE 5600.005Materials CharacterizationFall 2021 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2021 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2021 Syllabus SPOT
MTSE 3000.006Fundamentals of Materials Science and Engineering ISpring 2021 Syllabus SPOT
MTSE 6940.005Individual ResearchSpring 2021
MTSE 6940.105Individual ResearchSpring 2021
MTSE 6940.205Individual ResearchSpring 2021
MTSE 3000.003Fundamentals of Materials Science and Engineering IFall 2020 Syllabus SPOT
MTSE 6940.105Individual ResearchFall 2020
MTSE 6940.205Individual ResearchFall 2020
MTSE 5600.005Materials CharacterizationFall 2020 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2020 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2020 Syllabus
MTSE 3000.006Fundamentals of Materials Science and Engineering ISpring 2020
MTSE 6940.005Individual ResearchSpring 2020
MTSE 6940.105Individual ResearchSpring 2020
MTSE 6940.205Individual ResearchSpring 2020
MTSE 3000.003Fundamentals of Materials Science and Engineering IFall 2019 Syllabus SPOT
MTSE 6940.005Individual ResearchFall 2019
MTSE 6940.105Individual ResearchFall 2019
MTSE 6940.205Individual ResearchFall 2019
MTSE 5600.005Materials CharacterizationFall 2019 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2019 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2019 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2019
MTSE 3000.003Fundamentals of Materials Science and Engineering IFall 2018 Syllabus SPOT
MTSE 5600.005Materials CharacterizationFall 2018 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2018 Syllabus SPOT
MTSE 5800.022Special Studies in Materials ScienceFall 2018
MTSE 4900.005Special Topics in Materials Science and EngineeringFall 2018
MTSE 4070.005Electronic MaterialsSpring 2018 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2018 SPOT
MTSE 5610.605Fundamentals of Surface and Thin Film AnalysisSpring 2018 SPOT
MTSE 5920.005Research Problems in Lieu of ThesisSpring 2018
MTSE 6950.005Doctoral DissertationFall 2017
MTSE 5600.005Materials CharacterizationFall 2017 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2017 Syllabus SPOT
MTSE 6950.005Doctoral DissertationSpring 2017
MTSE 4070.005Electronic MaterialsSpring 2017 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2017 SPOT
MTSE 5610.605Fundamentals of Surface and Thin Film AnalysisSpring 2017 SPOT
MTSE 6950.005Doctoral DissertationFall 2016
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2016 Syllabus SPOT
MTSE 4900.021Special Topics in Materials Science and EngineeringFall 2016
MTSE 4900.022Special Topics in Materials Science and EngineeringFall 2016
MTSE 4900.023Special Topics in Materials Science and EngineeringFall 2016
MTSE 4900.024Special Topics in Materials Science and EngineeringFall 2016
MTSE 6950.005Doctoral DissertationSpring 2016
MTSE 4070.005Electronic MaterialsSpring 2016 Syllabus SPOT
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2016 SPOT
MTSE 5610.605Fundamentals of Surface and Thin Film AnalysisSpring 2016 SPOT
MTSE 6940.005Individual ResearchSpring 2016
MTSE 6940.105Individual ResearchSpring 2016
MTSE 6950.005Doctoral DissertationFall 2015
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2015 SPOT
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2015 Syllabus SPOT
MTSE 4070.005Electronic MaterialsSpring 2015 Syllabus
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2015
MTSE 6940.005Individual ResearchSpring 2015
MTSE 6940.105Individual ResearchSpring 2015
MTSE 6940.005Individual ResearchFall 2014
MTSE 6940.105Individual ResearchFall 2014
MTSE 6940.205Individual ResearchFall 2014
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2014
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2014 Syllabus
MTSE 4070.005Electronic MaterialsSpring 2014 Syllabus
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2014
MTSE 6940.005Individual ResearchSpring 2014
MTSE 5930.005Research Problems in Lieu of ThesisSpring 2014
MTSE 6900.005Special ProblemsSpring 2014
MTSE 6950.005Doctoral DissertationFall 2013
MTSE 6940.005Individual ResearchFall 2013
MTSE 5950.005Master's ThesisFall 2013
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2013
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2013 Syllabus
MTSE 6950.005Doctoral DissertationSummer 10W 2013
MTSE 6950.005Doctoral DissertationSpring 2013
MTSE 4070.005Electronic MaterialsSpring 2013 Syllabus
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2013
MTSE 6940.005Individual ResearchSpring 2013
MTSE 5950.005Master's ThesisSpring 2013
MTSE 6950.005Doctoral DissertationFall 2012
MTSE 6940.005Individual ResearchFall 2012
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2012
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2012 Syllabus
MTSE 6950.005Doctoral DissertationSummer 10W 2012
MTSE 6940.005Individual ResearchSummer 10W 2012
MTSE 5930.005Research Problems in Lieu of ThesisSummer 10W 2012
MTSE 4070.005Electronic MaterialsSpring 2012 Syllabus
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2012
MTSE 6940.005Individual ResearchSpring 2012
MTSE 6940.105Individual ResearchSpring 2012
MTSE 5920.005Research Problems in Lieu of ThesisSpring 2012
MTSE 5900.005Special Problems in Materials ResearchSpring 2012
MTSE 6940.005Individual ResearchFall 2011
MTSE 6940.105Individual ResearchFall 2011
MTSE 5600.005Materials CharacterizationFall 2011
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2011
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2011 Syllabus
MTSE 5920.005Research Problems in Lieu of ThesisFall 2011
MTSE 5930.005Research Problems in Lieu of ThesisFall 2011
MTSE 5900.005Special Problems in Materials ResearchFall 2011
MTSE 6940.005Individual ResearchSummer 5W1 2011
MTSE 6940.005Individual ResearchSummer 5W2 2011
MTSE 4070.005Electronic MaterialsSpring 2011 Syllabus
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2011
MTSE 6940.005Individual ResearchSpring 2011
MTSE 6940.005Individual ResearchFall 2010
MTSE 5600.005Materials CharacterizationFall 2010
MTSE 3090.005Materials Science and Engineering Laboratory IFall 2010
MTSE 3020.005Microstructure and Characterization of MaterialsFall 2010 Syllabus
MTSE 6900.005Special ProblemsFall 2010
MTSE 6940.005Individual ResearchSummer 10W 2010
MTSE 6900.005Special ProblemsSummer 10W 2010
MTSE 4070.005Electronic MaterialsSpring 2010
MTSE 6940.005Individual ResearchSpring 2010
MTSE 5900.005Special Problems in Materials ResearchSpring 2010
MTSE 3090.501Materials Science and Engineering Laboratory IFall 2009
MTSE 3020.508Microstructure and Characterization of MaterialsFall 2009
MTSE 4070.005Electronic MaterialsSpring 2009
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisSpring 2009
MTSE 3090.501Materials Science and Engineering Laboratory IFall 2008
MTSE 6940.005Individual ResearchSpring 2008
MTSE 5520.701Physical and Chemical Basis of Integrated Circuit FabricationSpring 2008
MTSE 6950.015Doctoral DissertationFall 2007
MTSE 5610.005Fundamentals of Surface and Thin Film AnalysisFall 2007
MTSE 6900.005Special ProblemsFall 2007
MTSE 6950.005Doctoral DissertationSummer 10W 2007
MTSC 5830.005Cooperative Education in Materials ScienceSpring 2007
MTSC 6950.005Doctoral DissertationSpring 2007
MTSC 5500.005Electronic, Optical and Magnetic MaterialsSpring 2007
MTSC 6950.015Doctoral DissertationFall 2006
MTSC 5610.005Fundamentals of Surface and Thin Film AnalysisFall 2006
MTSC 6950.005Doctoral DissertationSummer 5W1 2006
MTSC 6950.005Doctoral DissertationSpring 2006
MTSC 5500.005Electronic, Optical and Magnetic MaterialsSpring 2006
MTSC 5950.005Master's ThesisSpring 2006
MTSC 5610.005Fundamentals of Surface and Thin Film AnalysisFall 2005
MTSC 5950.005Master's ThesisFall 2005
MTSC 5950.015Master's ThesisFall 2005
MTSC 6900.005Special ProblemsFall 2005
MTSC 6900.015Special ProblemsFall 2005
MTSC 5950.005Master's ThesisSummer 5W2 2005
MTSC 5950.005Master's ThesisSummer 5W1 2005
MTSC 5500.005Electronic, Optical and Magnetic MaterialsSpring 2005
MTSC 6940.007Individual ResearchSpring 2005
MTSC 5900.705Special Problems in Materials ResearchSpring 2005
MTSC 6200.005Imperfections in SolidsFall 2004
MTSC 6940.005Individual ResearchFall 2004
MTSC 6940.015Individual ResearchFall 2004

Published Intellectual Contributions

    Conference Proceeding

  • Mo, Y., Ecton, P., Ballinger, A., Mahajan, H., Chang, A., Garrett, D., Lynch, M., Perez, J., Ukirde, V., El Bouanani, M. (2006). Diffusion of Silver in DC plasma prepared Diamond Like Carbon Films. APS Meeting Abstracts.
  • Journal Article

  • Li, S., Bodenstedt, K., Kharma, M., Burson, C.M., Alhmoud, D., Moulder, C.A., Farvid, S., Ghimire, M.M., Rawashdeh, A.M., El Bouanani, M., others. (2022). Can A Double-Doped Device Modification of A Standard Bilayer OLED Improve the Photo-And/or Electro-luminescence Efficiency? A Case Study of Architecture Design in Fluorescent Devices with A Potential Roadmap for High-Efficiency Phosphorescent Devices. Comments on Inorganic Chemistry. 42 (3) 145--173. Taylor & Francis.
  • El Bouanani, M., Perez, J., Philipose, U., Neogi, A., , Rout, B. (2020). Rapid ambient degradation of monolayer MoS2 after heating in air. 2D Materials.
  • El Bouanani, M. (2018). Effects of Argon Sputtering and UV-Ozone Radiation on the Physico- Chemical Surface Properties of ITO.
  • 2. P. R. Poudel, P.P. Poudel, B. Rout, M. El Bouanani, F.D. McDaniel. (2012). An XPS study to investigate the dependence of carbon ion fluences in the formation of buried SiC.
  • 1. P. R. Poudel, P.P. Poudel, Sharma, B.P., Hwang, J.Y., B. Rout, M. El Bouanani, F.D. McDaniel. (2012). Synthesis of buried layers of β-SiC in Si by multiple energy carbon ion implantations and post thermal annealing.
  • 3. Sonia Samuel , Soumya Nag, Seifollah Nasrazadani, Vaishali Ukirde, Mohamed El Bouanani, Arunesh Mohandas , Kytai Nguyen , Rajarshi Banerjee. (2010). Corrosion resistance and in vitro response of laser-deposited Ti-Nb-Zr-Ta alloys for orthopedic implant applications.
  • 4. H.N. Alshareef, C. Huffman, H.C. Wen, M. Quevedo-Lopez, B.E. Gnade and M. El-Bouanani. (2008). Impact of Carbon Incorporation on the Effective Work Function of Metal Nitride Gate Electrodes.
  • 5. D.A. Mazon-Montijo, M. Sotelo-Lerma, M. Quevedo-Lopez, M. El-Bouanani, H.N. Alshareef, F.J. Espinoza-Beltran, R. Ramirez-Bon. (2007). Morphological and chemical study of the initial growth of CdS thin films deposited using an ammonia-free chemical process.
  • 7. P. Pelicon, M. El Bouanani, G.V. Ravi Prasad , A. Razpet, B. N. Guo, D. Birt, J. L. Duggan and F. D. McDaniel. (2006). Depth of origin of desorbed boron In heavy ion irradiation of ultra-shallow boron implanted Si.
  • 8. M. M. Hussain, M. A. Quevedo-Lopez, H. N. Alshareef, H.C. Wen, D. Larison, B. Gnade and M. El-Bouanani. (2006). Thermal annealing effects on a representative high-k/metal film stack.
  • 10. T. N. Arunagiri, Y. Zhang, O. Chyan, M. El-Bouanani, M. J. Kim, C. T. Wu, K. H. Chen, and L. C. Chen. (2005). A 5 nm Ruthenium Thin Film as a Directly Plate-able Copper Diffusion Barrier.
  • H.N. Alshareef, H.C. Wen, H.R. Harris, K. Choi, H.F. Luan, P. Lysaght, P. Majhi, B.H. Lee, M. El-Bouanani,. (2005). Modulation of the work function of silicon gate electrode using thin TaN interlayers.
  • 11. Praveen Nalla, Shih-Huang Huang, Yibin Zhang, Oliver Chyan, Michael G. Richmond, and Mohamed El Bouanani. (2005). Photochemically Induced Metallization of Surface Silicon Using Dinuclear Metal Carbonyl Compounds. Anchoring of Ruthenium to a Si(111) Surface through Covalent Ru-Si Bond Formation.
  • 12. S. Addepalli, P. Sivasubramani, M. El-Bouanani, M. J. Kim, B. E. Gnade, and R. M. Wallace. (2004). Deposition of Hf-silicate gate dielectric on SixGe1-x(100): detection of interfacial layer growth.
  • 13. P. Punchaipetch, G. Pant, M. Quevedo-Lopez, C. Yao, M. El-Bouanani, M. J. Kim, R. M. Wallace, and B. E. Gnade. (2004). Low temperature deposition of hafnium silicate gate dielectrics.
  • 15. M.A. Quevedo-Lopez, M. El-Bouanani, M.J. Kim, B.E. Gnade, R.M. Wallace, M.R. Visokay, A. LiFatou, L.J. Chambers and L. Colombo. (2003). Effect of N incorporation on boron penetration from p+ polycrystalline Si through HfSixOy films.
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Overall
Summative Rating
Challenge and
Engagement Index
Response Rate

out of 5

out of 7
%
of
students responded
  • Overall Summative Rating (median):
    This rating represents the combined responses of students to the four global summative items and is presented to provide an overall index of the class’s quality. Overall summative statements include the following (response options include a Likert scale ranging from 5 = Excellent, 3 = Good, and 1= Very poor):
    • The course as a whole was
    • The course content was
    • The instructor’s contribution to the course was
    • The instructor’s effectiveness in teaching the subject matter was
  • Challenge and Engagement Index:
    This rating combines student responses to several SPOT items relating to how academically challenging students found the course to be and how engaged they were. Challenge and Engagement Index items include the following (response options include a Likert scale ranging from 7 = Much higher, 4 = Average, and 1 = Much lower):
    • Do you expect your grade in this course to be
    • The intellectual challenge presented was
    • The amount of effort you put into this course was
    • The amount of effort to succeed in this course was
    • Your involvement in course (doing assignments, attending classes, etc.) was
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