Faculty Profile

Mohamed El Bouanani

Title
Associate Professor
Department
Materials Science and Engineering
College
College of Engineering

    

Education

PhD, Universite Claude Bernard Lyon I, 1990.
Major: Physics
Universite Claude Bernard Lyon I, 1986.
Major: Nuclear and Atomic Physics and Applications

Current Scheduled Teaching*

MTSE 4070.005, Electronic Materials, Spring 2024 Syllabus
MTSE 5100.007, Fundamental Concepts of Materials Science, Spring 2024
MTSE 3000.007, Fundamentals of Materials Science and Engineering I, Spring 2024 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2024

* Texas Education Code 51.974 (HB 2504) requires each institution of higher education to make available to the public, a syllabus for undergraduate lecture courses offered for credit by the institution.

Previous Scheduled Teaching*

MTSE 5600.005, Materials Characterization, Fall 2023 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2023 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2023 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2023 SPOT
MTSE 5100.007, Fundamental Concepts of Materials Science, Fall 2022 SPOT
MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2022 Syllabus SPOT
MTSE 5600.005, Materials Characterization, Fall 2022 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2022 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2022 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2022 SPOT
MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2021 Syllabus SPOT
MTSE 6940.005, Individual Research, Fall 2021
MTSE 6940.105, Individual Research, Fall 2021
MTSE 5600.005, Materials Characterization, Fall 2021 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2021 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2021 Syllabus SPOT
MTSE 3000.006, Fundamentals of Materials Science and Engineering I, Spring 2021 Syllabus SPOT
MTSE 6940.005, Individual Research, Spring 2021
MTSE 6940.105, Individual Research, Spring 2021
MTSE 6940.205, Individual Research, Spring 2021
MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2020 Syllabus SPOT
MTSE 6940.105, Individual Research, Fall 2020
MTSE 6940.205, Individual Research, Fall 2020
MTSE 5600.005, Materials Characterization, Fall 2020 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2020 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2020 Syllabus
MTSE 3000.006, Fundamentals of Materials Science and Engineering I, Spring 2020
MTSE 6940.005, Individual Research, Spring 2020
MTSE 6940.105, Individual Research, Spring 2020
MTSE 6940.205, Individual Research, Spring 2020
MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2019 Syllabus SPOT
MTSE 6940.005, Individual Research, Fall 2019
MTSE 6940.105, Individual Research, Fall 2019
MTSE 6940.205, Individual Research, Fall 2019
MTSE 5600.005, Materials Characterization, Fall 2019 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2019 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2019 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2019
MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2018 Syllabus SPOT
MTSE 5600.005, Materials Characterization, Fall 2018 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2018 Syllabus SPOT
MTSE 5800.022, Special Studies in Materials Science, Fall 2018
MTSE 4900.005, Special Topics in Materials Science and Engineering, Fall 2018
MTSE 4070.005, Electronic Materials, Spring 2018 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2018 SPOT
MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2018 SPOT
MTSE 5920.005, Research Problems in Lieu of Thesis, Spring 2018
MTSE 6950.005, Doctoral Dissertation, Fall 2017
MTSE 5600.005, Materials Characterization, Fall 2017 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2017 Syllabus SPOT
MTSE 6950.005, Doctoral Dissertation, Spring 2017
MTSE 4070.005, Electronic Materials, Spring 2017 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2017 SPOT
MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2017 SPOT
MTSE 6950.005, Doctoral Dissertation, Fall 2016
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2016 Syllabus SPOT
MTSE 4900.021, Special Topics in Materials Science and Engineering, Fall 2016
MTSE 4900.022, Special Topics in Materials Science and Engineering, Fall 2016
MTSE 4900.023, Special Topics in Materials Science and Engineering, Fall 2016
MTSE 4900.024, Special Topics in Materials Science and Engineering, Fall 2016
MTSE 6950.005, Doctoral Dissertation, Spring 2016
MTSE 4070.005, Electronic Materials, Spring 2016 Syllabus SPOT
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2016 SPOT
MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2016 SPOT
MTSE 6940.005, Individual Research, Spring 2016
MTSE 6940.105, Individual Research, Spring 2016
MTSE 6950.005, Doctoral Dissertation, Fall 2015
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2015 SPOT
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2015 Syllabus SPOT
MTSE 4070.005, Electronic Materials, Spring 2015 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2015
MTSE 6940.005, Individual Research, Spring 2015
MTSE 6940.105, Individual Research, Spring 2015
MTSE 6940.005, Individual Research, Fall 2014
MTSE 6940.105, Individual Research, Fall 2014
MTSE 6940.205, Individual Research, Fall 2014
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2014
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2014 Syllabus
MTSE 4070.005, Electronic Materials, Spring 2014 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2014
MTSE 6940.005, Individual Research, Spring 2014
MTSE 5930.005, Research Problems in Lieu of Thesis, Spring 2014
MTSE 6900.005, Special Problems, Spring 2014
MTSE 6950.005, Doctoral Dissertation, Fall 2013
MTSE 6940.005, Individual Research, Fall 2013
MTSE 5950.005, Master's Thesis, Fall 2013
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2013
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2013 Syllabus
MTSE 6950.005, Doctoral Dissertation, Summer 10W 2013
MTSE 6950.005, Doctoral Dissertation, Spring 2013
MTSE 4070.005, Electronic Materials, Spring 2013 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2013
MTSE 6940.005, Individual Research, Spring 2013
MTSE 5950.005, Master's Thesis, Spring 2013
MTSE 6950.005, Doctoral Dissertation, Fall 2012
MTSE 6940.005, Individual Research, Fall 2012
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2012
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2012 Syllabus
MTSE 6950.005, Doctoral Dissertation, Summer 10W 2012
MTSE 6940.005, Individual Research, Summer 10W 2012
MTSE 5930.005, Research Problems in Lieu of Thesis, Summer 10W 2012
MTSE 4070.005, Electronic Materials, Spring 2012 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2012
MTSE 6940.005, Individual Research, Spring 2012
MTSE 6940.105, Individual Research, Spring 2012
MTSE 5920.005, Research Problems in Lieu of Thesis, Spring 2012
MTSE 5900.005, Special Problems in Materials Research, Spring 2012
MTSE 6940.005, Individual Research, Fall 2011
MTSE 6940.105, Individual Research, Fall 2011
MTSE 5600.005, Materials Characterization, Fall 2011
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2011
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2011 Syllabus
MTSE 5920.005, Research Problems in Lieu of Thesis, Fall 2011
MTSE 5930.005, Research Problems in Lieu of Thesis, Fall 2011
MTSE 5900.005, Special Problems in Materials Research, Fall 2011
MTSE 6940.005, Individual Research, Summer 5W1 2011
MTSE 6940.005, Individual Research, Summer 5W2 2011
MTSE 4070.005, Electronic Materials, Spring 2011 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2011
MTSE 6940.005, Individual Research, Spring 2011
MTSE 6940.005, Individual Research, Fall 2010
MTSE 5600.005, Materials Characterization, Fall 2010
MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2010
MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2010 Syllabus
MTSE 6900.005, Special Problems, Fall 2010
MTSE 6940.005, Individual Research, Summer 10W 2010
MTSE 6900.005, Special Problems, Summer 10W 2010
MTSE 4070.005, Electronic Materials, Spring 2010
MTSE 6940.005, Individual Research, Spring 2010
MTSE 5900.005, Special Problems in Materials Research, Spring 2010
MTSE 3090.501, Materials Science and Engineering Laboratory I, Fall 2009
MTSE 3020.508, Microstructure and Characterization of Materials, Fall 2009
MTSE 4070.005, Electronic Materials, Spring 2009
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2009
MTSE 3090.501, Materials Science and Engineering Laboratory I, Fall 2008
MTSE 6940.005, Individual Research, Spring 2008
MTSE 5520.701, Physical and Chemical Basis of Integrated Circuit Fabrication, Spring 2008
MTSE 6950.015, Doctoral Dissertation, Fall 2007
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2007
MTSE 6900.005, Special Problems, Fall 2007
MTSE 6950.005, Doctoral Dissertation, Summer 10W 2007
MTSC 5830.005, Cooperative Education in Materials Science, Spring 2007
MTSC 6950.005, Doctoral Dissertation, Spring 2007
MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2007
MTSC 6950.015, Doctoral Dissertation, Fall 2006
MTSC 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2006
MTSC 6950.005, Doctoral Dissertation, Summer 5W1 2006
MTSC 6950.005, Doctoral Dissertation, Spring 2006
MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2006
MTSC 5950.005, Master's Thesis, Spring 2006
MTSC 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2005
MTSC 5950.005, Master's Thesis, Fall 2005
MTSC 5950.015, Master's Thesis, Fall 2005
MTSC 6900.005, Special Problems, Fall 2005
MTSC 6900.015, Special Problems, Fall 2005
MTSC 5950.005, Master's Thesis, Summer 5W2 2005
MTSC 5950.005, Master's Thesis, Summer 5W1 2005
MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2005
MTSC 6940.007, Individual Research, Spring 2005
MTSC 5900.705, Special Problems in Materials Research, Spring 2005
MTSC 6200.005, Imperfections in Solids, Fall 2004
MTSC 6940.005, Individual Research, Fall 2004
MTSC 6940.015, Individual Research, Fall 2004

* Texas Education Code 51.974 (HB 2504) requires each institution of higher education to make available to the public, a syllabus for undergraduate lecture courses offered for credit by the institution.

Published Publications

Published Intellectual Contributions

Conference Proceeding
Mo, Y., Ecton, P., Ballinger, A., Mahajan, H., Chang, A., Garrett, D., Lynch, M., Perez, J., Ukirde, V., El Bouanani, M. (2006). Diffusion of Silver in DC plasma prepared Diamond Like Carbon Films. APS Meeting Abstracts.
Journal Article
Li, S., Bodenstedt, K., Kharma, M., Burson, C. M., Alhmoud, D., Moulder, C. A., Farvid, S., Ghimire, M. M., Rawashdeh, A. M., El Bouanani, M., others, (2022). Can A Double-Doped Device Modification of A Standard Bilayer OLED Improve the Photo-And/or Electro-luminescence Efficiency? A Case Study of Architecture Design in Fluorescent Devices with A Potential Roadmap for High-Efficiency Phosphorescent Devices. Comments on Inorganic Chemistry. 42(3), 145--173. Taylor & Francis.
El Bouanani, M., Perez, J., Philipose, U., Neogi, A., Rout, B., (2020). Rapid ambient degradation of monolayer MoS2 after heating in air. 2D Materials.
El Bouanani, M. (2018). Effects of Argon Sputtering and UV-Ozone Radiation on the Physico- Chemical Surface Properties of ITO.
El Bouanani, M. (2012). An XPS study to investigate the dependence of carbon ion fluences in the formation of buried SiC.
El Bouanani, M. (2012). Synthesis of buried layers of β-SiC in Si by multiple energy carbon ion implantations and post thermal annealing.
El Bouanani, M. (2010). Corrosion resistance and in vitro response of laser-deposited Ti-Nb-Zr-Ta alloys for orthopedic implant applications.
El Bouanani, M. (2008). Impact of Carbon Incorporation on the Effective Work Function of Metal Nitride Gate Electrodes.
El Bouanani, M. (2007). Morphological and chemical study of the initial growth of CdS thin films deposited using an ammonia-free chemical process.
El Bouanani, M. (2006). Depth of origin of desorbed boron In heavy ion irradiation of ultra-shallow boron implanted Si.
El Bouanani, M. (2006). Thermal annealing effects on a representative high-k/metal film stack.
El Bouanani, M. (2005). A 5 nm Ruthenium Thin Film as a Directly Plate-able Copper Diffusion Barrier.
El Bouanani, M. (2005). Modulation of the work function of silicon gate electrode using thin TaN interlayers.
El Bouanani, M. (2005). Photochemically Induced Metallization of Surface Silicon Using Dinuclear Metal Carbonyl Compounds. Anchoring of Ruthenium to a Si(111) Surface through Covalent Ru-Si Bond Formation.
El Bouanani, M. (2004). Deposition of Hf-silicate gate dielectric on SixGe1-x(100): detection of interfacial layer growth.
El Bouanani, M. (2004). Low temperature deposition of hafnium silicate gate dielectrics.
El Bouanani, M. (2003). Effect of N incorporation on boron penetration from p+ polycrystalline Si through HfSixOy films.
,
Overall
Summative Rating
Challenge and
Engagement Index
Response Rate

out of 5

out of 7
%
of
students responded
  • Overall Summative Rating (median):
    This rating represents the combined responses of students to the four global summative items and is presented to provide an overall index of the class’s quality. Overall summative statements include the following (response options include a Likert scale ranging from 5 = Excellent, 3 = Good, and 1= Very poor):
    • The course as a whole was
    • The course content was
    • The instructor’s contribution to the course was
    • The instructor’s effectiveness in teaching the subject matter was
  • Challenge and Engagement Index:
    This rating combines student responses to several SPOT items relating to how academically challenging students found the course to be and how engaged they were. Challenge and Engagement Index items include the following (response options include a Likert scale ranging from 7 = Much higher, 4 = Average, and 1 = Much lower):
    • Do you expect your grade in this course to be
    • The intellectual challenge presented was
    • The amount of effort you put into this course was
    • The amount of effort to succeed in this course was
    • Your involvement in course (doing assignments, attending classes, etc.) was
CLOSE