Faculty Profile

Mohamed El Bouanani

Title
Associate Professor
Department
Materials Science and Engineering
College
College of Engineering

    

    

      


                          

            
Curriculum Vitae

            

              Click Here to View Faculty CV
            

          

        
                          

            
Education

            



  

  


  
PhD, Universite Claude Bernard Lyon I, 1990. 
Major: Physics
Universite Claude Bernard Lyon I, 1986. 
Major: Nuclear and Atomic Physics and Applications





          

        
                

          
Current Scheduled Teaching*


          
MTSE 4070.005, Electronic Materials, Spring 2023 Syllabus
MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2023 


          
*
  Texas Education Code 51.974 (HB 2504) requires each institution of
  higher education to make available to the public, a syllabus for
  undergraduate lecture courses offered for credit by the institution.
  

        

      

    

  


    

    

      


        


          


            
Previous Scheduled Teaching*


            
                    

                    MTSE 5100.007, Fundamental Concepts of Materials Science, Fall 2022  SPOT
                    

                    MTSE 3000.003, Fundamentals of Materials Science and Engineering   I, Fall 2022 Syllabus SPOT
                    

                    MTSE 5600.005, Materials Characterization, Fall 2022  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2022 Syllabus SPOT
                    

                    MTSE 4070.005, Electronic Materials, Spring 2022 Syllabus SPOT
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2022  SPOT
                    

                    MTSE 3000.003, Fundamentals of Materials Science and Engineering I, Fall 2021 Syllabus SPOT
                    

                    MTSE 6940.005, Individual Research, Fall 2021 
                    

                    MTSE 6940.105, Individual Research, Fall 2021 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2021  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2021 Syllabus SPOT
                    

                    MTSE 4070.005, Electronic Materials, Spring 2021 Syllabus SPOT
                    

                    MTSE 3000.006, Fundamentals of Materials Science and Engineering   I, Spring 2021 Syllabus SPOT
                    

                    MTSE 6940.005, Individual Research, Spring 2021 
                    

                    MTSE 6940.105, Individual Research, Spring 2021 
                    

                    MTSE 6940.205, Individual Research, Spring 2021 
                    

                    MTSE 3000.003, Fundamentals of Materials Science and Engineering   I, Fall 2020 Syllabus SPOT
                    

                    MTSE 6940.105, Individual Research, Fall 2020 
                    

                    MTSE 6940.205, Individual Research, Fall 2020 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2020  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2020 Syllabus SPOT
                    

                    MTSE 4070.005, Electronic Materials, Spring 2020 Syllabus
                    

                    MTSE 3000.006, Fundamentals of Materials Science and Engineering   I, Spring 2020 
                    

                    MTSE 6940.005, Individual Research, Spring 2020 
                    

                    MTSE 6940.105, Individual Research, Spring 2020 
                    

                    MTSE 6940.205, Individual Research, Spring 2020 
                    

                    MTSE 3000.003, Fundamentals of Materials Science and Engineering   I, Fall 2019 Syllabus SPOT
                    

                    MTSE 6940.005, Individual Research, Fall 2019 
                    

                    MTSE 6940.105, Individual Research, Fall 2019 
                    

                    MTSE 6940.205, Individual Research, Fall 2019 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2019  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2019 Syllabus SPOT
                    

                    MTSE 4070.005, Electronic Materials, Spring 2019 Syllabus SPOT
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2019 
                    

                    MTSE 3000.003, Fundamentals of Materials Science and Engineering   I, Fall 2018 Syllabus SPOT
                    

                    MTSE 5600.005, Materials Characterization, Fall 2018  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2018 Syllabus SPOT
                    

                    MTSE 5800.022, Special Studies in Materials Science, Fall 2018 
                    

                    MTSE 4900.005, Special Topics in Materials Science and Engineering, Fall 2018 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2018 Syllabus SPOT
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2018  SPOT
                    

                    MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2018  SPOT
                    

                    MTSE 5920.005, Research Problems in Lieu of Thesis, Spring 2018 
                    

                    MTSE 6950.005, Doctoral Dissertation, Fall 2017 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2017  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2017 Syllabus SPOT
                    

                    MTSE 6950.005, Doctoral Dissertation, Spring 2017 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2017 Syllabus SPOT
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2017  SPOT
                    

                    MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2017  SPOT
                    

                    MTSE 6950.005, Doctoral Dissertation, Fall 2016 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2016 Syllabus SPOT
                    

                    MTSE 4900.021, Special Topics in Materials Science and Engineering, Fall 2016 
                    

                    MTSE 4900.022, Special Topics in Materials Science and Engineering, Fall 2016 
                    

                    MTSE 4900.023, Special Topics in Materials Science and Engineering, Fall 2016 
                    

                    MTSE 4900.024, Special Topics in Materials Science and Engineering, Fall 2016 
                    

                    MTSE 6950.005, Doctoral Dissertation, Spring 2016 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2016 Syllabus SPOT
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2016  SPOT
                    

                    MTSE 5610.605, Fundamentals of Surface and Thin Film Analysis, Spring 2016  SPOT
                    

                    MTSE 6940.005, Individual Research, Spring 2016 
                    

                    MTSE 6940.105, Individual Research, Spring 2016 
                    

                    MTSE 6950.005, Doctoral Dissertation, Fall 2015 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2015  SPOT
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2015 Syllabus SPOT
                    

                    MTSE 4070.005, Electronic Materials, Spring 2015 Syllabus
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2015 
                    

                    MTSE 6940.005, Individual Research, Spring 2015 
                    

                    MTSE 6940.105, Individual Research, Spring 2015 
                    

                    MTSE 6940.005, Individual Research, Fall 2014 
                    

                    MTSE 6940.105, Individual Research, Fall 2014 
                    

                    MTSE 6940.205, Individual Research, Fall 2014 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2014 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2014 Syllabus
                    

                    MTSE 4070.005, Electronic Materials, Spring 2014 Syllabus
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2014 
                    

                    MTSE 6940.005, Individual Research, Spring 2014 
                    

                    MTSE 5930.005, Research Problems in Lieu of Thesis, Spring 2014 
                    

                    MTSE 6900.005, Special Problems, Spring 2014 
                    

                    MTSE 6950.005, Doctoral Dissertation, Fall 2013 
                    

                    MTSE 6940.005, Individual Research, Fall 2013 
                    

                    MTSE 5950.005, Master's Thesis, Fall 2013 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2013 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2013 Syllabus
                    

                    MTSE 6950.005, Doctoral Dissertation, Summer 10W 2013 
                    

                    MTSE 6950.005, Doctoral Dissertation, Spring 2013 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2013 Syllabus
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2013 
                    

                    MTSE 6940.005, Individual Research, Spring 2013 
                    

                    MTSE 5950.005, Master's Thesis, Spring 2013 
                    

                    MTSE 6950.005, Doctoral Dissertation, Fall 2012 
                    

                    MTSE 6940.005, Individual Research, Fall 2012 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2012 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2012 Syllabus
                    

                    MTSE 6950.005, Doctoral Dissertation, Summer 10W 2012 
                    

                    MTSE 6940.005, Individual Research, Summer 10W 2012 
                    

                    MTSE 5930.005, Research Problems in Lieu of Thesis, Summer 10W 2012 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2012 Syllabus
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2012 
                    

                    MTSE 6940.005, Individual Research, Spring 2012 
                    

                    MTSE 6940.105, Individual Research, Spring 2012 
                    

                    MTSE 5920.005, Research Problems in Lieu of Thesis, Spring 2012 
                    

                    MTSE 5900.005, Special Problems in Materials Research, Spring 2012 
                    

                    MTSE 6940.005, Individual Research, Fall 2011 
                    

                    MTSE 6940.105, Individual Research, Fall 2011 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2011 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2011 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2011 Syllabus
                    

                    MTSE 5920.005, Research Problems in Lieu of Thesis, Fall 2011 
                    

                    MTSE 5930.005, Research Problems in Lieu of Thesis, Fall 2011 
                    

                    MTSE 5900.005, Special Problems in Materials Research, Fall 2011 
                    

                    MTSE 6940.005, Individual Research, Summer 5W2 2011 
                    

                    MTSE 6940.005, Individual Research, Summer 5W1 2011 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2011 Syllabus
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2011 
                    

                    MTSE 6940.005, Individual Research, Spring 2011 
                    

                    MTSE 6940.005, Individual Research, Fall 2010 
                    

                    MTSE 5600.005, Materials Characterization, Fall 2010 
                    

                    MTSE 3090.005, Materials Science and Engineering Laboratory I, Fall 2010 
                    

                    MTSE 3020.005, Microstructure and Characterization of Materials, Fall 2010 Syllabus
                    

                    MTSE 6900.005, Special Problems, Fall 2010 
                    

                    MTSE 6940.005, Individual Research, Summer 10W 2010 
                    

                    MTSE 6900.005, Special Problems, Summer 10W 2010 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2010 
                    

                    MTSE 6940.005, Individual Research, Spring 2010 
                    

                    MTSE 5900.005, Special Problems in Materials Research, Spring 2010 
                    

                    MTSE 3090.501, Materials Science and Engineering Laboratory I, Fall 2009 
                    

                    MTSE 3020.508, Microstructure and Characterization of Materials, Fall 2009 
                    

                    MTSE 4070.005, Electronic Materials, Spring 2009 
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Spring 2009 
                    

                    MTSE 3090.501, Materials Science and Engineering Laboratory I, Fall 2008 
                    

                    MTSE 6940.005, Individual Research, Spring 2008 
                    

                    MTSE 5520.701, Physical and Chemical Basis of Integrated Circuit Fabrication, Spring 2008 
                    

                    MTSE 6950.015, Doctoral Dissertation, Fall 2007 
                    

                    MTSE 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2007 
                    

                    MTSE 6900.005, Special Problems, Fall 2007 
                    

                    MTSE 6950.005, Doctoral Dissertation, Summer 10W 2007 
                    

                    MTSC 5830.005, Cooperative Education in Materials Science, Spring 2007 
                    

                    MTSC 6950.005, Doctoral Dissertation, Spring 2007 
                    

                    MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2007 
                    

                    MTSC 6950.015, Doctoral Dissertation, Fall 2006 
                    

                    MTSC 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2006 
                    

                    MTSC 6950.005, Doctoral Dissertation, Summer 5W1 2006 
                    

                    MTSC 6950.005, Doctoral Dissertation, Spring 2006 
                    

                    MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2006 
                    

                    MTSC 5950.005, Master's Thesis, Spring 2006 
                    

                    MTSC 5610.005, Fundamentals of Surface and Thin Film Analysis, Fall 2005 
                    

                    MTSC 5950.005, Master's Thesis, Fall 2005 
                    

                    MTSC 5950.015, Master's Thesis, Fall 2005 
                    

                    MTSC 6900.005, Special Problems, Fall 2005 
                    

                    MTSC 6900.015, Special Problems, Fall 2005 
                    

                    MTSC 5950.005, Master's Thesis, Summer 5W1 2005 
                    

                    MTSC 5950.005, Master's Thesis, Summer 5W2 2005 
                    

                    MTSC 5500.005, Electronic, Optical and Magnetic Materials, Spring 2005 
                    

                    MTSC 6940.007, Individual Research, Spring 2005 
                    

                    MTSC 5900.705, Special Problems in Materials Research, Spring 2005 
                    

                    MTSC 6200.005, Imperfections in Solids, Fall 2004 
                    

                    MTSC 6940.005, Individual Research, Fall 2004 
                    

                    MTSC 6940.015, Individual Research, Fall 2004 

          


          
*
  Texas Education Code 51.974 (HB 2504) requires each institution of
  higher education to make available to the public, a syllabus for
  undergraduate lecture courses offered for credit by the institution.
  

        

      

    

  

  
  	

	

	  

		

		   
Published Publications



  

  
Published Intellectual Contributions


  
Conference Proceeding
Mo, Y., Ecton, P., Ballinger, A., Mahajan, H., Chang, A., Garrett, D., Lynch, M., Perez, J., Ukirde, V., El Bouanani, M.  (2006). Diffusion of Silver in DC plasma prepared Diamond Like Carbon Films. APS Meeting Abstracts. 
Journal Article
Li, S., Bodenstedt, K., Kharma, M., Burson, C. M., Alhmoud, D., Moulder, C. A., Farvid, S., Ghimire, M. M., Rawashdeh, A. M., El Bouanani, M., others,  (2022). Can A Double-Doped Device Modification of A Standard Bilayer OLED Improve the Photo-And/or Electro-luminescence Efficiency? A Case Study of Architecture Design in Fluorescent Devices with A Potential Roadmap for High-Efficiency Phosphorescent Devices. Comments on Inorganic Chemistry. 42(3), 145--173. Taylor & Francis. 
Li, S., Bodenstedt, K., Kharma, M., Burson, C. M., Alhmoud, D., Moulder, C. A., Farvid, S., Ghimire, M. M., Rawashdeh, Abdel Monem M.,, El Bouanani, M., Omary, M. A. (2021). Can A Double-Doped Device Modification of A Standard Bilayer OLED Improve the Photo- And/or Electro-luminescence Efficiency? A Case Study of Architecture Design in Fluorescent Devices with A Potential Roadmap for High-Efficiency Phosphorescent Devices. Comments on Inorganic Chemistry. 
El Bouanani, M., Perez, J., Philipose, U., Neogi, A., Rout, B., (2020). Rapid ambient degradation of monolayer MoS2 after heating in air. 2D Materials. 
El Bouanani, M.  (2018). Effects of Argon Sputtering and UV-Ozone Radiation on the Physico- Chemical Surface Properties of ITO. 
El Bouanani, M.  (2012). An XPS study to investigate the dependence of carbon ion fluences in the formation of buried SiC. 
El Bouanani, M.  (2012). Synthesis of buried layers of β-SiC in Si by multiple energy carbon ion implantations and post thermal annealing. 
El Bouanani, M.  (2010). Corrosion resistance and in vitro response of laser-deposited Ti-Nb-Zr-Ta alloys for orthopedic implant applications. 
El Bouanani, M.  (2008). Impact of Carbon Incorporation on the Effective Work Function of Metal Nitride Gate Electrodes. 
El Bouanani, M.  (2007). Morphological and chemical study of the initial growth of CdS thin films deposited using an ammonia-free chemical process. 
El Bouanani, M.  (2006). Depth of origin of desorbed boron In heavy ion irradiation of ultra-shallow boron implanted Si. 
El Bouanani, M.  (2006). Thermal annealing effects on a representative high-k/metal film stack. 
El Bouanani, M.  (2005). A 5 nm Ruthenium Thin Film as a Directly Plate-able Copper Diffusion Barrier. 
El Bouanani, M.  (2005). Modulation of the work function of silicon gate electrode using thin TaN interlayers. 
El Bouanani, M.  (2005). Photochemically Induced Metallization of Surface Silicon Using Dinuclear Metal Carbonyl Compounds. Anchoring of Ruthenium to a Si(111) Surface through Covalent Ru-Si Bond Formation. 
El Bouanani, M.  (2004). Deposition of Hf-silicate gate dielectric on SixGe1-x(100): detection of interfacial layer growth. 
El Bouanani, M.  (2004). Low temperature deposition of hafnium silicate gate dielectrics. 
El Bouanani, M.  (2003). Effect of N incorporation on boron penetration  from p+ polycrystalline Si through HfSixOy  films. 



	
		
		
	  

	

	

  
    
	

	

	  

		

		   	
		
		
	  

	

	

	
	

  
  
  

  	

		

		,  
			
				

					
					Overall
Summative Rating		
					Challenge and
Engagement Index		
					Response Rate
					
				

			
			
				

					
					
out of 5		
					
out of 7		
					%
 of 
students responded		
					
					
				

			
		


		
    
			
  • Overall Summative Rating (median):
    
			This rating represents the combined responses of students to the four global summative items and is presented to provide an overall index of the class’s quality. Overall summative statements include the following (response options include a Likert scale ranging from 5 = Excellent, 3 = Good, and 1= Very poor):
				
      
					
    • The course as a whole was
      • 
					
    • The course content was
      • 
					
    • The instructor’s contribution to the course was
      • 
					
    • The instructor’s effectiveness in teaching the subject matter was
      • 
				
    
			
    • 
			
  • Challenge and Engagement Index:
    
			This rating combines student responses to several SPOT items relating to how academically challenging students found the course to be and how engaged they were. Challenge and Engagement Index items include the following (response options include a Likert scale ranging from 7 = Much higher, 4 = Average, and 1 = Much lower):
				
      
					
    • Do you expect your grade in this course to be
      • 
					
    • The intellectual challenge presented was
      • 
					
    • The amount of effort you put into this course was
      • 
					
    • The amount of effort to succeed in this course was
      • 
					
    • Your involvement in course (doing assignments, attending classes, etc.) was
      • 
				
    
			
    • 
		

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